The EAC people, have un-veiled a new testing method for checking the so called "DAE" quality of optical storage devices. As the new method says "...The graph tells a lot about the abilities of the drive. The quality of the optical system (and/or of the error correction capabilities of the firmware) is shown in at which time index the error start. The error hiding qualities are shown when the wedge gets bigger..." A MUST read for all those who are testing optical storage devices. You would need to create a test disc, according to the instructions, in order to perform the tests. For more information click upon the "Source" link. We will evaluate the new testing method and possibly will be added in all up-coming hardware reviews :-)